Tekran 3342 Dilution Probe0 pages

230 Tech Center Drive, Knoxville, TN 37912 USA
Ph: +1-865-688-0688 Fax: +1-865-766-8422
www.tekran.com cemparts@tekran.com

Tekran 3342 Dilution Probe
Rev. 042114

The electrically heated Tekran 3342 dilution probe is
used in conjunction with the Tekran 3300Xi HgCEM
System, where the measuring of process gas requires
dilution and transport of sample gas to the detection
system. The Tekran 3342 probe and filter are specifically
designed for transport of flue gases with minimal Hg loss
due to transport inefficiencies. The Tekran 3342 dilution
probe enables the user to adapt the probe to a wide
range of sampling applications.
The Tekran 3342 sample contact points are all silcocoated for minimal Hg loss. The filter used with the
Tekran 3342 is constructed of Titanium to resist mercury
absorption. The probe is a low flow filtered separator with
dilution of sample at the probe. It incorporates automated
filter and stinger blowback along with through the probe
multi-level calibration capabilities. All gasket materials used are Kalrez. The filter and stinger
temperatures can be locally or remotely controlled. The eductor inlet pressure is monitored and used
to control eductor pump flow. Pressures above and below the critical orifice are continuously
monitored to automatic correct for changes in gas density. The entire assembly is temperature
controlled within 1 °C. The Tekran 3342 unit also incorporates the ability to calibrate pre and post filter,
to ensure filter integrity and troubleshooting information. The sample gas is carried via heated sample
line to the Tekran 3300Xi Hg CEM system for further conditioning and final measurement.

Specifications:
Tekran 3342 Specifications
Dilution rates of critical orifices a - g

Description
3

Sample flow rates with critical orifices a - g
Dilution factor adaptability
Dilution gas flow rate with eductor version I
or II
Dilution gas pressure on inlet of pressure
controller
Bypass eductor /B: gas pressure-gas flow
rate-sample gas flow rate
Process pressure
Process temperature bias
Low or overpressure bias
Atmospheric pressure bias
Materials in contact with the sample gas
Weight

a = 500 b = 200 c = 100 d = 50 e = 30* f = 20 g = 10 : 1
a = 23.3, b = 45.0, c = 91.7 ,d = 183.3 ,e = 316.7*,
1
f = 466.7, g = 916.7 l/m
2
Dilution gas pressure-adjustment -5% to +30%
I: 8.0 – 10.0N L/m, optional for higher dilution rates
II: 30.0-50.0 N L/m
min. 65 psig, max. 232 psig
approx. 29 psig - eductor gas approx. 5.0 L/m
sample gas approx. 2.5 L/m
26.5 up to 59 In Hg abs.
Operation independent from process temperature
No fault as long as the differential pressure ΔP at the
dilution unit is >15” Hg g and test gas is given to the probe
under process conditions
<1% with a variation of 1.5” Hg
Hastelloy & Stainless with Silco coatings and Titanium
Approx. 66 lbs

*Standard, others to be indicated along with order, intermediate values possible. 1) approx. at 3 45 psig dilution gas behind
pressure con-troller. 2) -5% not possible for orifice „g“. 3) With eductor version I. Further technical data see leaflet SP2000,
2-1.1a.
WHERE MEASUREMENT BEGINS