Digital Serial Analyzer Sampling Oscilloscope DSA83000 pages
Digital Serial Analyzer Sampling Oscilloscope
nnnnDSA8300 Datasheet
nnnnThe DSA8300 is a state-of-the-art Equivalent Time Sampling Oscilloscope that provides
nnnnthe highest fidelity measurement and analysis capabilities for Communications Signal
nnnnAnalysis, Serial Data Network Analysis, and Serial Data Link Analysis applications.
nnnnFeatures & Benefits
nnnnHighest Fidelity Signal Capture
nnnn■ Very Low Time-base Jitter
nnnn- 425 fs Typical on up to 8 Simultaneously Acquired Channels
nnnn<200 fs Typical on up to 6 Channels with 82A04 Phase Reference
nnnnModule
nnnn■ Best Vertical Resolution -16 bit A/D
nnnn- Electrical Resolution: <20 |JV LSB (for 1 Vfull range)
nnnn- Optical Resolution depends on the Dynamic Range of the Optical
nnnnModule - Ranges from <20 nW for the 80C07B (1 mW full range) to
nnnn<0.6 |JW for the 80C10B (30 mW full range)
nnnnFlexible Configurations
nnnn■ With Today's Sampling Module Portfolio, the DSA8300 supports up to 8
nnnnSimultaneously Acquired Signals
nnnn■ A Wide Variety of Optical, Electrical, and Accessory Modules to support
nnnnyour Specific Testing Requirements
nnnn■ Optical Modules
nnnn- Fully Integrated Optical Modules that support all Standard Optical
nnnnData Rates from 155 Mb/s to 100 Gb/s
nnnn- Certified Optical Reference Receivers Support Specified
nnnnRequirements for Standards-mandated Compliance Testing
nnnn- Optical Bandwidths to >80 GHz
nnnn- High Optical Sensitivity and Low Noise as well as the Wide Dynamic
nnnnRange of the Optical Sampling Modules allows Accurate Testing and
nnnnCharacterization of Short-reach to Long-haul Optical Communications
nnnnStandards
nnnn- Fully Calibrated Clock Recovery Solutions - No need to manually
nnnncalibrate for data pick-off losses
nnnnCalibrated Extinction Ratio Measurements ensure Repeatability of
nnnnExtinction Ratio Measurements to <0.5 dB among Systems with
nnnnModules with this Factory Calibration Option
nnnn■ Electrical Modules
nnnn- Electrical Bandwidths to >70 GHz
nnnn- Very Low-noise Electrical Samplers (280 |JV at 20 GHz, 450 |JV at
nnnn60 GHz, typical)
nnnn- Selectable Bandwidths (with 80E07, 08, 09,10) allow the User to
nnnnTrade-off Sampler Bandwidth and Noise for Optimal Data Acquisition
nnnnPerformance
nnnn- Remote Samplers (80E07,08,09,10) or Compact Sampling Extender
nnnnModule Cables support Minimal Signal Degradation by allowing the
nnnnSampler to be Located in Close Proximity to the Device Under Test
nnnn- World's Highest-performance Integrated TDR (10 ps typical step rise
nnnntime) supports Exceptional Impedance Discontinuity Characterization
nnnnand High Dynamic Range for S-parameter Measurements to 50 GHz
nnnnAnalysis
nnnn■ Standard Analysis Capabilities
nnnn- Complete Suite of over 120 Automated Measurements for NRZ, RZ,
nnnnand Pulse Signal Types
nnnn- Automated Mask Testing with over 80 Industry-standard Masks. New
nnnnMasks can be Imported into the DSA8300 to support New Emerging
nnnnStandards. In Addition, Users can Define their own Masks for
nnnnAutomated Mask Testing
nnnn- Vertical and Horizontal Histograms for Statistical Analysis of Acquired
nnnnWaveforms
nnnn- Vertical, Horizontal, and Waveform Cursors (with measurements)
nnnn■ Jitter, Noise, BER, and Serial Data Link Analysis is provided through the
nnnn80SJNB Basic and Advanced Software Application Options
nnnn■ Advanced TDR Analysis, S-parameter Measurements, Simulation Model
nnnnExtraction, and Serial Link Simulation Capabilities are provided through
nnnnthe IConnect® Software Application Options
nnnnHigh Test Throughput
nnnn■ High Sample Acquisition Rate up to 300 kS/s per channel
nnnn■ Efficient Programmatic Interface (IEEE-488, Ethernet, or local processor
nnnnaccess) enable High Test Throughput
nnnnTektronix
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