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AR-PPLN Test Sample0 pages
AR-PPLN Test Sample
D ATA S H E E T 3 2
AR-PPLN Test Sample for
Piezoresponse Force Microscopy
The AR-PPLN Test Sample is a convenient
and reliable sample for practice, setup, and
verification for a wide variety of Piezoresponse Force Microscopy (PFM) techniques.
This includes, but is not limited to, imaging
and point hysteresis loops. The reference
sample has stripe domains permanently
polarized for easy identification and optimization of PFM parameters.
Description
The Periodically Poled Lithium Niobate Test
Sample (AR-PPLN) consists of a 3mm x 3mm
LiNbO3 transparent die that is 0.5mm thick. The
active area is an alternating pattern of oppositely
Figure 1: The AR-PPLN (unmounted) clipped into a High
Voltage sample holder. Note that the sample is mounted
at ~45° relative to the axes of the scanner, insuring domain
contrast if the cantilever is scanned at either 0° or 90°.
poled stripe domains that are parallel to one axis
of the die and cover the entire die surface. The pitch
of the domains is 10µm.
Figure 2: Vertical PFM phase (a) and amplitude (b) overlaid on the rendered topography for the AR-PPLN Test Sample. Lateral
phase (c) and amplitude (d) were imaged simultaneously. Imaging performed with an Olympus Electri-lever. 50μm scan.
