Swept Test System0 pages
SANTEC TUNABLE LASERS
High Speed Swept Test System
SANTEC TUNABLE LASERS
Typical configuration
Swept Test System
TSL-510/TSL-710
Power Monitor (Reference)
Trigger out
SPU-100
BNC Cable
BNC Cable
USB Cable
Santec Swept Test System has been developed to streamline
photonic testing, providing a complete solution where
high-speed analysis with high resolution and accuracy is
key. Combining Santec’s tunable laser, TSL-510 or TSL-710,
with a Santec Swept Processing Unit SPU-100 and custom
software the complete Swept Test System optimizes WDL
and PDL measurement for use in both R&D and production
environments. Using real-time referencing, while
simultaneously
acquiring
output
power
from
TSL-510/TSL-710 and the transmitted optical power
through the DUT, provides high accuracy in WDL and PDL
analysis. The Swept Test System can allow fast PDL
measurements based on Mueller Matrix method.
Over-sampling and a rescaling algorithm are used to
maximize
testing
throughput
while
maintaining
measurement integrity. The system is particularly suited to
transmission spectra characterization such as that required
for DWDM components and High Q photonic devices. Rapid
sweep and accurate measurement saves time and ensures
the integrity and validity of your device characterization.
Optical
Power Meter
DUT3
DUT4
GP-IB Cable
Specifications
Parameter
Unit
Dynamic Range for IL (typ.)
dB
Wavelength Accuracy (typ.)
(Absolute)
Wavelength Accuracy *1 (typ.)
(Relative)
pm
pm
pm
pm
pm
pm
nm/s
sec
sec
pm
Applications
Scan Speed
Measurement time for IL
Measurement time for IL/PDL
Wavelength Resolution
Specifications
TSL-510
Type A
Type B
Type C
Type D
30
70
30
70
50
Real-time power referencing
Optical components and modules characterization
Insertion Loss Accuracy
Accurate WDL/PDL characteristics measurement
Tunable Filters, Interleavers, Fiber Bragg Gratings
High power repeatability <+/-0.02dB
(FBGs), Couplers, Splitters, Isolators, Switches
Insertion Loss Repeatability *2, *3
Insertion Loss Resolution
High PDL repeatability +/-0.01dB
WSS, Wavelength Blockers
PDL Accuracy
DWDM components
Rescaling algorithm utilizing the Swept Processing
Photonic material characterization
Optical spectroscopy
Operating Temperature
Operating humidity
1
dB
dB
Unit (data acquisition unit)
PDL Repeatability *3, *4
PDL Resolution
Communication
+/-57
+/-63
+/-27
+/-33
+/-11
+/-13
dB
Automatic normalization of laser source power
70
dB
dB
degC
%
High wavelength resolution and accuracy
Reduced measurement time
Multi-channel measurement is available.
Supporting LabVIEW control software
Convenient set up of measurement parameters
Data analysis
Trigger Out
DUT1
DUT2
Wavelength Repeatability *2
Features
Trigger In
Output
dB
-
50
1 to 40
+/-5.2
+/-11.5
+/-3.7
+/-10.0
+/-1.5
+/-4.0
70
4
18
TSL-710
Type D
70
70
+/-2.8
+/-8.4
+/-2.0
+/-7.6
+/-1.0
+/-3.0
0.5 to 40
0.1
+/-0.02
+/-0.03
+/-0.02 (+/-0.01(typ.))
0.01
+/-(0.02 + 3% of PDL)
+/-(0.15 + 3% of PDL) (typ.)
+/-0.01
0.01
USB (USB 2.0 High Speed)
GP-IB (IEEE488.2)
15 to 35
<80
Notes
At Bandpass filter
At Notch filter
At 10nm/s
At 40nm/s
At 10nm/s
At 40nm/s
At 10nm/s
At 40nm/s
*4, 5 at 40nm/s
*4, 5 at 40nm/s
0 to 20dB device IL
20 to 40dB device IL
0 to 20dB device IL
20 to 40dB device IL
SPU-100 / PC
TSL/ OPM / PC
non condensing
All specifications applies with Agilent optical power meter N774*A.
*1 Temperature within 25ºC±5ºC
*2 Temperature within 25ºC±1ºC
*3 Does not include influence of connector.
*4 The measurement condition is within wavelength resolution 5pm, wavelength range 40nm for 1 channel.
*5 Measurement dynamic range is up to 50dB.
www.santec.com
E-Mail : sales@santec.com
2005 © SANTEC CORPORATION Santec reserves the right to make changes in equipment design, components or specifications without notices.
SANTEC CORPORATION
5823 Ohkusa-Nenjyozaka, Komaki, Aichi 485-0802, Japan Tel. +81-568-79-1959 Fax +81-568-79-1718
SANTEC U.S.A. CORPORATION
433 Hackensack Ave., Hackensack, NJ, 07601, U.S.A. Toll Free +1-800-726-8321 (santec-1) Tel. +1-201-488-5505 Fax +1-201-488-7702
SANTEC EUROPE LIMITED
Magdalen Centre, Robert Robinson Ave., The Oxford Science Park, Oxford OX4 4GA, U.K. Tel. +44-1865-784960 Fax +44-1865-784961
SANTEC (SHANGHAI) Co., Ltd.
No.800 Zhangyang Road Changhang Tower, Pudong District, Shanghai 200122 China Tel: +86-21-58361261, +86-21-58361262 Fax: +86-21-58361263
Swept Test System-C-E / Ver.1.1 CODE-201303-HK-MT-CPY