Parametric Curve Tracer Configurations0 pages

2600-PCT-xB

Model 2600-PCT-4B

•t Complete solutions engineered
for optimum price and
performance
•t Field upgradable and reconfigurable – convert your PCT to a
reliability or wafer sort tester
•t Configurable power levels:
–– From 200V to 3kV
–– From 1A to 100A
•t Wide dynamic range:
–– From µV to kV
–– From fA to 100A
•t Full range of capacitancevoltage (C-V) capability :
–– From fF to µF
–– Supports 2, 3, and 4 terminal
devices
–– Up to 3kV DC bias

High Power Device Characterization
Developing and using MOSFETS, IGBTs, diodes and other high power devices
requires comprehensive device-level characterization such as breakdown voltage,
on-state current and capacitance measurements. Keithley’s line of high power
Parametric Curve Trace configurations supports the full spectrum of device types
and test parameters. Keithley’s Parametric Curve Trace configurations include
everything necessary for the characterization engineer to develop a complete test
system quickly. ACS Basic Edition software provides complete device characterization, including both real-time trace mode for quickly checking fundamental
deivce parameters like breakdown voltage and full parametric mode for extracting
precise device parameters. ACS Basic Edition goes beyond traditional curve tracer
interfaces by offering a broad array of sample libraries. More important, users have
complete control of all test resources, allowing the creation of more advanced tests
than previously possible on a curve tracer.

Electrical characterization of a variety of power device types, including:
MOSFET

BJT

IGBT

Diode

Triac

Capacitor

Resistor

And many more…

Measurements of key parameters, such as:
Breakdown Voltage
(Bvdss, Bvceo)

On-State Current
(Vdson, Vcesat, Vf)

Drain/Collector Leakage
(Idss, Ir/Icbo,Iceo)

Gate/Base Leakage
(Igss, Ib)

Threshold or Cutoff voltage
(Vth, Vf, Vbeon)

Forward Transfer
(yfs, Gfs, Hfe, gain)

Capacitance (Ciss, Coss, Crss)

And many more…

•t High performance test fixture
supports a range of package
types
•t Probe station interface supports
most probe types including HV
triax, SHV coax, standard triax,
and others
APPLICATIONS
•t Power semiconductor device
characterization and testing

SEMICONDUCTOR

Parametric curve tracer configurations

with Model 8010
Test Fixture

Parametric curve tracer configurations

Parametric Curve Tracer Configurations

•t Characterization of GaN and
SiC, LDMOS and other devices
•t Reliability studies on power
devices
•t Incoming inspection and device
qualification

1.888.KEITHLEY (U.S. only)
www.keithley.com
A Greater Measure of Confidence

A Tektronix Company