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HIOKI 3535 LCR HiTESTER0 pages
Component measuring instruments
Measure across the broad frequency range of 100kHz to 120MHz
with the new Model 3535 LCR HiTESTER. The 6ms highspeed
measurement capability is particularly useful with the builtin
comparator and load functions, and for BIN (classification)
measurements, to suit a wide range of applications such as chip
inductor and high speed magnetic head testing, as well as other
related research needs. Achieve ultimate measurement flexibility
by detaching the head amp unit from the main unit and placing
it in proximity to the test object so as to minimize the effect of
test leads on measurements. The 3535's low price, ideal size and
light weight are all achieved by incorporating an automatically
balanced bridge circuit with digital control. Never before has
such an advanced precision instrument coupled with economical
features been placed on the test and measurement market.
3535 LCR HiTESTER
HEAD AMP UNIT
