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W55

Technical data HOMMEL-ETAMIC W55
Measurement principlet

Tracing method calibrated

Total deviation acc. to DIN 4772t

Class 1

Measuring ranges/resolutiont

± 8 µm/1 nm; ± 80 µm/10 nm; ± 400 µm/50 nm; ± 800 µm/100 nm

Filter: cut-off lengths
t

0.025; 0.08; 0.25; 0.8; 2.5; 8 (mm); selectable in -2 to +1 cut-off steps;
variable from 0.001 to 80 in steps of 0.001

DIN 4768t

RC, digitally calculated [mm], cut-off lengths 0.025; 0.08; 0.25; 0.8; 2.5; 8

ISO 11562/ISO 16610-21, (50 % Gauss) t

Gauss (M1) digital cut-off lengths 0.025; 0.08; 0.25; 0.8; 2.5; 8

ISO 13565-1t

2x Gauss (M2) Rk-parameter, cut-off lengths 0,025; 0,08; 0,25; 0,8; 2,5; 8

ISO 3274t

Short-wave cut-off length λs; selectable in steps λc / λs 30; 100; 300

Traverse speed vtt

lt – assigned 0.05; 0.15; 0.5 mm/s; variable 0.01 - 2.0 mm/s in 0.01 steps

Scan distances lt t

0.48; 1.5; 4.8; 15; 48 mm or variable from 0.1 – 120 mm, dependent on traverse unit

Traverse lengths ln t

0.40; 1.25; 4.0; 12.5; 40 mm or variable cut-off lengths

Cut-off λ [mm]t

0.08; 0.25; 0.8; 2.5; 8.0

Roughness parameters: ISO 4287t
t

Ra; Rz; Rmax; Rt; Rq; Rsk; lmo; lo; Rdq; da; ln; La; Lq; Rdc; Rv; Rz-ISO; R3z; Rpm; Rp3z; R3zm; Rp;
D; RPc; RSm; Rpm/R3z; lr; Rku; tpif; tpia; tpip; tpic; Rt/Ra; Rz1; Rz2; Rz3; Rz4; Rz5; Rmr; Rmr%; Api

Core roughness parameters: ISO 13565t

Rpk*; Rpk; Rk; Rvk*; Rvk; Mr1; Mr 2; A1; A2; Vo(70%)0.01* Rv/Rk

Profile parameters: ISO 4287t

Pt´; Pp; Pz; Pa; Pq; Psk; PSm; Pdq; lp; Pku; tpaf; tpaa; tpab; tpac; Pmr0; APa; APa%; Pmr; Pmr%

Waviness parameters: ISO 4287t

Wt´; Wp; Wz; Wa; Wq; Wsk; WSm; Wdq; lw; Wku

Motif parameters: ISO 12085t

R; Rx; AR; Nr; W; Wx; AW; Nw; Wte; Tpaf(CR, CL, CF)

Roughness parameters: JIS B – 0601t

Rz-JIS; Rmax-JIS

Statisticst

(n, x, S, R, max, min) per measuring program from 1 to 999 measurements

Screen and print outputs t
t

Surface characteristic values; statistics; profile position; P-, R-, W-, K-profile;
material ratio; measuring conditions; tolerances

Peripheral connections t
t

Linear traverse unit: waveline™ 20; 120; Measuring columns: wavelift™ 400; 2 x USB
on the front, 2 x USB on the rear, LAN 10/100 (RJ45); RS232 (9-PIN-D-Sub)

Power supplyt

100 V – 240 Volt, 50-60 Hz, 160 VA

HOMMEL-ETAMIC W55
Roughness measurement and evaluation with workshop performance

Jenoptik Industrial Metrology Germany GmbH
Alte Tuttlinger Straße 20
D-78056 Villingen-Schwenningen
Phone +49 7720 602-0

Operating temperature without condensation t +10°C to + 45°C, relative humidity max. 85%; ∆T 2°C/h
Storage temperature t

- 20°C to + 50°C

Close to you. Group companies in:
Germany
France
Switzerland
Spain

Roughness measuring stations
HOMMEL-ETAMICt
W55 R20-300t

HOMMEL-ETAMIC
W55 R120-400

t Traverse unitt
waveline™ 20t
waveline™ 120 basic
tGuidancet
Skidlesst
Skidless
t Tracing lengtht
20 mmt
120 mm
t Tracing speedt
0.05 – 3 mm/sec.t
0.01 – 3 mm/sec.
t Straightness accuracyt
< 0.2 µm / 20 mmt
≤ 0,4 µm / 120 mm
t Probet
TKU 300t
TKU 300
t Max. measuring ranget
± 300 µmt
± 300 µm
t Measuring columnt ManualtMotorized
t Vertical adjustment ranget
300 mmt
400 mm
t Tilting unitt
± 180ºt
± 45º
t Fine adjustment ranget
–t
± 5º
t Traverse speedt
–t
0.1 – 12 mm/sec
t Positioning repeatabilityt
–t
< 12 µm
t Granite plate dimensionst
400 x 280 mmt
780 x 500 mm

China
Singapore
South Korea
India

Affiliates and representation worlwide:

www.jenoptik.com/metrology
Interested? Please contact us:

06/2013

info-de.im@jenoptik.com

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Copyright © JENOPTIK Industrial Metrology Germany GmbH. All rights reserved. Subject to change without notice. The photos may show options and are not legally binding.

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