VisIR Spectrophotometer0 pages

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Vis IR

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Spectrophotometer

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SPECIAL FEATURES

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• Continuously Adjustable Sample and Detection

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Angles

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• Vis to IR, wide wavelength range

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• Reflectance and Transmission Measurements

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• Diverse samples up to 50-mm square

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• High performance monochromator

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• Reflectometer Model 107

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GENERAL DESCRIPTION

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McPherson, Inc. Vis IR Spectrophotometers can be

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equipped in a variety of ways. We have routine reflecto-

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meters and special versions for vacuum ref lectometry.

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We can equip these systems with any monochromator

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from our line so you can specify the wavelength resolu-

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tion and bandpass you need.

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M

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Vis IR Reflectance and Transmittance Spectrophotom-

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eter features continuously adjustable sample and

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detector angles. The reflectometer is easy to use and

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the new, stabilized single beam spectrophotometer

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provides improved measurement precision. The double

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monochromator consists of a prism predisperser

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combined with the monochromator. This assures low

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levels of stray light, provides uncontaminated spectra,

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and eliminates filters. SNAP IN gratings and

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thermoelectrically cooled detectors permit operation

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from 190 to 350-nm with Deuterium and 350 to 2500-nm

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with tungsten sources. Bilaterally adjustable slits allow

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the user to adjust bandpass for the measurements

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requirement.

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The Vis IR Spectrophotometer is complete with inte-

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grated software controls of all acquisition functions.

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Data is displayed during scans and extensive post

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processing arithmetic, display and plotting capabilities

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are included.

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Vis IR Spectrophotometer with Reflectometer

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Specifications

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Wavelength Range 1 :

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Wavelength Range 2:

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Spectral Resolution:

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Bandpass:

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Stray Light:

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Sample Size:

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Sample Angle:

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Detection Angle:

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Transmittance:

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195 to 350-nm with Deuterium

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350 to 2500-nm with Tungsten

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0.1 -nm nominal in the Visible

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variable from 0.1 to 16-nm

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1 part in 10 6

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50-mm square maximum

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continuously variable from 0 to

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89-degrees

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continuously variable from 10

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to 180-degrees

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sample at 0-degrees,

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detector at 180-degrees

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Direct angular readout of sample and detector positions. Detector 1 :

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Position locks for optimum repeatability in routine Detector 2:

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applications (e.g. witness samples.) Detector 3:

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PMTfor190to900-nm

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Si for 350 to 1000-nm

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PbS for 1000 to 2800-nm

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7 A Stuart Road • Chelmsford, MA 01824 USA* Tel. 978-256-4512, 1 -800-255-1055 (US) • Fax: 978-250-8625 • Email: MCP@mcphersoninc.com

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