Phenom XL0 pages

Specification Sheet | Microscopes

Phenom XL
Desktop SEM for large samples

Phenom XL

Throughput and speed

All-in-one imaging and analysis system

Fastest loading cycle in the world

Largest sample size in its class

Secondary electron detector

Motorized scan of samples up to 100 mm x 100 mm

Detection of low-energy electrons for topographical
and surface information

Fully Integrated EDS

Never lost navigation

Elemental analysis is as easy as imaging, with fully
integrated EDS

Permanent optical overview for swift navigation to any
region on the sample