Single probe Double Layer Detection System for solar wafers (Solar sensors WF14x15AQ453S)0 pages
WF14x15AQ453S
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Rev. 1.5 / 08.02.2011
Double cell detection of crystalline solar cells
Eddy current measurement principle
For mounting in „Schmalz Wafer Gripper SWG“
Very fast reaction time – less than 20 ms
Analogue output signal for connection to PLC
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1 – Crystalline Solar cell
2 – Schmalz Wafer Gripper SWG
3 – Roland Sensor WF14x15AQ453S
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