LIN and MOST ECL Physical Interface (Rev. A) 0 pages

RXD
TXD
NWake
INH
EN
LIN
GND
Receiver
Filter
VSUP
VSUP
Wake Up, State,
and INH Control
Fault
Detection
and Protection
Driver
With Slope
Control
VSUP/2
Filter
SN65HVDA195-Q1
www.ti.com SLLS961A –JULY 2009–REVISED OCTOBER 2009
LIN AND MOST ECL PHYSICAL INTERFACE
Check for Samples: SN65HVDA195-Q1
1FEATURES
• LIN Physical Layer Specification Revision 2.0 • Extended Operation With Supply From 7 V to
Compliant and Conforms to SAEJ2602 27 V DC (LIN Specification 7 V to 18 V)
Recommended Practice for LIN • Interfaces to Microcontroller With 5-V or 3.3-V
• LIN Bus Speed up to 20-kbps LIN Specified I/O Pins
Maximum and MOST ECL Speeds Down to • Wake-Up Request on RXD Pin
0 Baud • Control of External Voltage Regulator (INH Pin)
• Supports ISO9141 (K-Line) • Integrated Pullup Resistor and Series Diode
• Qualified for Automotive Applications for LIN Slave Applications
• Sleep Mode: Ultra Low Current Consumption, • Low Electromagnetic Emission (EME), High
Allows Wake-Up Events From LIN Bus, Electromagnetic Immunity (EMI)
Wake-Up Input (External Switch), or Host • Bus Terminal Short Circuit Protected for
Microcontroller Short to Battery or Short to Ground
• High-Speed Receive Capable • Thermally Protected
• ESD Protection to ±12 kV (Human-Body Model) • Ground Disconnection Fail Safe at System
on LIN Pin Level
• LIN Pin Handles Voltage From –40 V to 40 V • Ground Shift Operation at System Level
• Survives Transient Damage in Automotive • Unpowered Node Does Not Disturb the
Environment (ISO 7637) Network
FUNCTIONAL BLOCK DIAGRAM
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date. Copyright © 2009, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.