A513 Q PN M19 VariableAngle reflec0 pages
BRUKER
nnnnProduct Note M19-01/11
nnnnA513/Q
nnnnVariable angle reflection
nnnnaccessory
nnnnFeatures
nnnn■ High throughput design
nnnn■ Angles variable from 13 - 85° degrees
nnnn■ Fixed, horizontal sample position
nnnn■ Pre-aligned QuickLock base plate mount
nnnnOptions
nnnn■ Computer controlled version option A513/QA
nnnn■ Sample holder for solid materials A513-S
nnnnmax. 40x60mm2, min. ca. 40x20mm2
nnnn■ Sample holder for liquids A513-L
nnnn■ ZnSe ATR crystal with sample mount A513-A
nnnn■ Computer controlled IR polarizer holder A121/x
nnnnThe A513/Q is a high performance variable angle reflection
nnnnaccessory optimized for the Bruker FT-IR spectrometers.
nnnnIt is available in both a manually adjusted and a computer-
nnnncontrolled version. The incidence and collection angles can
nnnnbe independently adjusted.
nnnnThe A513/Q can accommodate either a manual or a comput-
nnnner controlled polarizer holder. In its automated configuration
nnnnthe incidence angle, collection angle and polarizer position
nnnncan all be controlled from the software. This eliminates the
nnnnneed to break the spectrometer purge or vacuum.
nnnnThe unique sample mounting system ensures angular repro-
nnnnducibility, thus no optical realignment is necessary after an
nnnnangel change.
nnnnControl software for OPUS is included with the accessory.
nnnnApplications
nnnn■ Infrared Reflection Absorption Spectroscopy
nnnn(IRRAS) of monolayers or sub-monolayers
nnnn■ Langmuir-Blodgett films
nnnn■ Material characterization
nnnn■ Corrosion analysis
nnnn■ Semiconductors
nnnnA 5nm polymer film on aluminum measured at 80° angle of
nnnnincidence and p-polarization, 50 scans (ca. 20 sec.) with a
nnnnBruker vacuum FT-IR spectrometer.
nnnnFor more information visit : www.brukeroptics.com
nnnnwww.brukeroptics. com
nnnnBruker Optics
nnnnBruker Optics is continually improving its products and reserves the right to change specifications without notice
nnnn© 2011 Bruker Optics BOPT- 4000217 - 01
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