GX52950 pages

GX5295
DYNAMIC DIGITAL I/O WITH PER CHANNEL PROGRAMMABLE LOGIC
LEVELS AND PMU PXI CARD
• 32 input / output channels, dynamically configurable on a per channel basis
• 4 control / timing channels with programmable levels
• 256 MB of on-board vector memory
• Per channel Drive / sense voltage range of -2 V to +7 V with PMU per pin
• 100 MHz vector rate
• Stimulus / Response & Real-time Compare modes

The GX5295 offers outstanding digital test capabilities and
channel density in a compact 3U PXI form factor. Offering both
performance digital and analog test capabilities, the GX5295
provides a cost-effective, tester per pin architecture - making
this card the ideal choice for high throughput, mixed-signal
component test applications. Each digital channel can be
individually programmed for a drive hi, drive lo, sense hi, sense
lo, and load value (with commutation voltage level). In addition,
each channel offers a parametric measurement unit (PMU)
providing users with the capability to perform parallel DC
measurements on the DUT (device under test).
The GX5295 supports deep pattern memory by offering 256 MB
of on-board vector memory with dynamic per pin direction
control and with test rates up to 100 MHz. The board supports
both Stimulus / Response and Real-time Compare modes of
operation, allowing the user to maximize test throughput
for go / no-go testing of components and UUTs that require
deep memory test patterns. The single board design supports
both master and slave functionality without the use of add-on
modules.

FEATURES
The GX5295’s pin electronic resources are independent on a per
channel basis and include a full-featured PMU for DC
characterization of DUTs. The PMU can operate in the force
voltage / measure current or force current / measure voltage
mode. In addition, the driver and receiver can be configured to
support differential input and output signals from / to the UUT.
A windowing method is utilized for memory accesses, which
limits the required PCI memory space for each board to only 16
MB, thus preserving test system resources. A direct mode, for
continuous data transfer between the test system controller and
the I/O pins of the GX5295 is also supported.

The GX5295 offers 256 MB of vector memory, with 64 Mb per
channel. Programmable I/O width allows trading vector width
for vector depth. Under software control, the GX5295’s vector
memory can be configured to support channel widths of 32, 16,
8, 4, 2 and 1 with corresponding vector depths of 64 Mb, 128
Mb, 256 Mb, 512 Mb, 1024 Mb, and 2048 Mb.
The GX5295 provides programmable LVTTL output clocks and
strobes, and supports external clock and strobe. A
programmable PLL (phase locked loop) provides configurable
clock frequencies and delays. Additionally, 4 additional pin
electronics resources are available for use as timing and/or
control resources - providing programmable drive and sense
levels from -2 to +7 V.
The GX5295’s sequencer can halt or pause on a defined address
or loop through the entire memory as well as loop on a defined
address range or through a defined block of memory. Two
modes of digital test are also supported - a Stimulus / Response
and a real-time compare mode. The Stimulus / Response mode
is used for driving and capturing data. Alternatively, for digital
tests requiring long test vectors, the real-time compare mode
can be used to significantly shorten overall test times by
comparing in real-time, expected test results and logging only
failed vectors and resultant test results (pass or fail).

Toll Free: 888-TEST-BY-PXI • Phone: 949-263-2222 • Fax: 949-263-1203 • email: sales@marvintest.com • www.marvintest.com

DIGITAL I/O

DESCRIPTION