Surftest Extreme0 pages

An inspection certificate is supplied as standard.
Refer to page IX for details.

Equipped with a variety of
parameters.
Evaluation Type Surface
Roughness Tester that is also
equipped with analysis functions.
The analysis unit is equipped with the
FORMTRACEPAK Surface Roughness /
Contour analysis program.
High-resolution type Z1-axis detector is
provided as standard. The highest display
resolution of the Z1 axis is 0.0001µm (when
the measuring range is 8µm.)
X-axis drive unit is equipped with a builtin high-precision glass scale to achieve the
highly accurate positioning for the travel
direction (X axis). SV-3100 series employs a
ceramic guide for the drive unit to enhance
resistance to abrasion for a long service life.
The resolution of the X axis is 0.05µm.
Detectors with standard or low measuring
force, 4mN or 0.75mN, are selectable
whether the instrument is equipped with the
inclinable drive unit or not.

Surftest SV-3100
SERIES 178 — Desktop Surface Roughness Tester

SV-3100

L

SPECIFICATIONS
SV-3100S4

Model No.
Measuring
range/
Resolution
Drive unit

Z1 axis
Travel range of the
X axis
X-axis straightness
Measuring speed
Z2 axis (column)

Assessed profile
Parameter
Analysis graph
Data compensation functions
Filter

Cutoff value

s
c
f
h
l

Sampling length
Recording
magnification
Detector
Power supply
External
dimensions
(W D H)
Mass

Vertical magnification
Horizontal magnification
Detection method
Stylus & Measuring force
Measuring main unit
Measuring main unit

SV-3100H4

SV-3100W4
SV-3100S8
800µm/0.01µm, 80µm/0.001µm, 8µm/0.0001µm

100mm

SV-3100H8

SV-3100W8

200mm

0.5µm/200mm
(0.05+0.001L)µm (L: Measuring length (mm))
0.02, 0.05, 0.1, 0.2, 0.5, 1.0, 2.0, 5.0mm/s
500mm (motorized)*1
300mm (motorized)*1
500mm (motorized)*1
300mm (motorized)* 1
Primary profile, Roughness profile, Waviness profile, Filtered waviness profile, Rolling circle waviness profile, Rolling circle center line waviness profile
Envelope residual profile, DIN4776 profile, Roughness motif profile, Waviness motif profile
Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, P ∆q, Pm (rc), Pmr, P c, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, R ∆q, Rm (rc), Rmr, R c,
Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, W ∆q, Wm (rc), Wmr, W c, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R,
Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, ∆a, a, q, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAW
ADC, BAC, Power spectrum chart, Auto-correlation chart, Walsh power spectrum chart, Walsh auto-correlation chart,
Slope distribution chart, Local peak distribution chart, Parameter distribution chart
Tilt compensation (General/First half/Second half/Anchor/Arbitrary), R-surface compensation, Ellipse compensation,
Parabola compensation, Hyperbolic compensation, Conic compensation, Polynomial compensation
Gaussian, 2CR75, 2CR50, 2CRPC75, 2CRPC50, Robust-Spline
0.0008, 0.0025, 0.008, 0.025, 0.08, 0.25, 0.8mm
0.025, 0.08, 0.25, 0.8, 2.5, 8, 25mm, arbitrary (0.025 to 50mm)
0.08, 0.25, 0.8, 2.5, 8, 25, 80mm, arbitrary (0.025 to 50mm)
0.025, 0.08, 0.25, 0.8, 2.5, 8mm, arbitrary (0.025 to 50mm)
0.08, 0.25, 0.8, 2.5, 8, 25mm, arbitrary (0.025 to 50mm)
0.025, 0.08, 0.25, 0.8, 2.5, 8, 25mm, arbitrary (0.025 to 50mm)
10X to 500,000X, Auto
0.5X to 10,000X, Auto
Differential inductance
0.75mN stylus tip (cone): Tip taper angle: 60 , Tip radius: 2µm
4mN stylus tip (cone): Tip taper angle: 90 , Tip radius: 5µm
100V 50/60Hz
756 482 996mm
140kg

756 482 1166mm

1156 482 1176mm

766 482 996mm

766 482 1166mm

1166 482 1176mm

150kg
220kg
140kg
150kg
220kg
Note: While the appearance of the natural stone measuring table varies according to the source, the high stability for which this material is
known can always be relied upon.
*1: Manual operation is also available.

Mitutoyo operates a policy of continuous improvement that aims to provide the customer with the benefit of the latest technological advances.
Therefore the company reserves the right to change any or all aspects of any product specification without notice.

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