Wafer and Thin Film Thickness Measurement0 pages
A worldwide leader in precision measurement solutions
76-300 mm wafer diameters
High-resolution LCD display
Menu-driven for fast, easy setup
5-point, TTV and bow measurements
Ethernet and RS232 computer interface
Wafer Measurement Systems for
Semiconducting and Semi-insulating Wafers
Front USB interface for easy data storage
Up to 1700µm measurement range
Cost-effective alternative to fully-automated wafer inspection systems
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