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High Performance SWIR Imaging Cameras
Introduction to SWIR Imaging
Silicon based area detectors (e.g. CCDs or CMOS) are widely used in high performance imaging
applications, detecting wavelengths from soft x-ray through to near infrared (NIR). Typically the
quantum efficiency (QE) of these detectors decreases rapidly as the detection wavelength increases
further into the NIR region.
Detector Material
Si
Silicon
Typical VIS-IR
Detection Range
400nm - l.Oum
Indium Gallium
InGaAs 400nm-2.6u.rn
Arsenide
Ge
Germanium 800nm-l.8u.rn
InSb
Indium
Antimonide
lu.m - 5u.m
HgCdTe
(or MCT)
Mercury
Cadmium
Telluride
1.5u.m - 12u.m
Table 1: Common detector materials and their
typical detection range within the VIS-IR wavelength
regions.
Above llOOnm, Silicon is transparent and
therefore cannot be used to detect photons of
these wavelengths, however many other
materials do have photon sensitivity at these
wavelengths and longer, see Table 1. The
materials listed have been developed into
detection systems which enable images to be
acquired within the various regions of the
visible to infrared spectrum. The typical
definition for each 'sub-region' within VIS-IR
wavelength range is outlined in Figure 1. Each
of the materials above present their own
advantages and challenges and therefore prior
to detector selection the user must consider all
aspects of the intended application, in addition
to simply the wavelength response.
Visible
(400-750) nm
NIR
(750-1000) nm
SWIR
(1.0-2.5)jim
MWIR
(2.5-5.0) nm
LWIR 1
(8.0-12.0) nm A
►
Figure 1: The typical definition of the various sub-regions of the electromagnetic spectrum, covering visible
through to infrared wavelengths.
The use of imaging systems to capture long wavelength photons (beyond the detection range of Silicon
based devices) continues to increase in many diverse application areas, such as life sciences, security &
surveillance, non-destructive testing, quality control and astronomy. This paper will be restricted to a
discussion of the performance of InGaAs detector arrays, sensitive in the VIS-SWIR region, i.e. (400-
1700) nm.
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