Our instruments are characterized by the simplest possible operation combined with the capability of a high throughput. When it comes to new developments, we take great care to secure that the instruments will not "feel" like a prototype afterwards. Naturally, also new developments are supported by a corresponding software. Take cantilever change as an example: For our DS 95 AFM, exchanging the cantilever takes only some seconds. Adjustment and approach are fully automatic, and optionally we also offer a full automatic cantilever changer. Furthermore, all our AFM scanners have a built-in optics facilitating the location of a specific place on the sample surface. Both guarantee efficient work and a high throughput.
DS 95 - Systems0 pages
http://www.dme-spm.com
http://www.dme-spm.de
Since 1987 manufacturer of
Scanning Probe Microscopes
Two standard sizes:
50 x 50 x 5 µm and 200 x 200 x 15 µm, both scanners show
atomic surface layers
Compact probe scanner, the cantilever moves during scanning,
not the sample
Can be operated in any orientation
No need of a special sample holder
Supports most AFM modes without additional add-ons
Built-in microscope objective for rough positioning
Fully automatic laser alignment
Foolproof cantilever change within seconds
Z-linearization
Can be mounted in a wide range of different
platforms