Our instruments are characterized by the simplest possible operation combined with the capability of a high throughput. When it comes to new developments, we take great care to secure that the instruments will not "feel" like a prototype afterwards. Naturally, also new developments are supported by a corresponding software. Take cantilever change as an example: For our DS 95 AFM, exchanging the cantilever takes only some seconds. Adjustment and approach are fully automatic, and optionally we also offer a full automatic cantilever changer. Furthermore, all our AFM scanners have a built-in optics facilitating the location of a specific place on the sample surface. Both guarantee efficient work and a high throughput.
LOADING
DME DualScope DS95 AFM Objective for Optical Microscopes0 pages
نسخه متنی
"
*t In all Optical Microscopes
nnnnDualScope 95 AFM Objective
nnnnfor Optical Microscopes
nnnnDanish Micro Engineering A/S
nnnnDME NanoTechnologie GmbH
"