XL-PMI+
XRF Analyzer

Eliminate the
guesswork—verify
metal alloys for
manufacturing
quality assurance.

GE introduces the XL-PMI x-ray fluorescence
(XRF) analyzers—powered by Thermo Fisher
Scientific technology. Where low detection
limits and high sample throughput are critical,
our perfect combination of hardware, software,
and direct industry experience helps meet your
specific analytical requirements.
The XL-PMI Series is just another example of
how we’re improving the health of industry.

Breakthrough Technology—the XL-PMI+ Advantage
GE’s XL-PMI+ analyzer combines advanced electronics and materials
technology with dynamic features and the most versatile x-ray
tubes ever used in a handheld XRF instrument. When this power is
harnessed to our groundbreaking technology, it takes your analytical
capabilities to a whole new level. The direct benefits to you include:
real-time results, advanced light element analysis, and ultimate
performance in our robust, proven design. From their extraordinary
speed and precision to the integrated, tilting, color, touchscreen
display and the customizable menus for ease of use, ergonomic XLPMI analyzers are lightweight, ruggedly constructed, and fast.
What is the XL-PMI+ advantage? Our technology delivers vast
improvements in sensitivity and measurement times—as much
as 10-times faster than conventional Si-PIN detectors, and up to
3-times more precise than conventional silicon drift detectors (SDD).
We achieved this improvement by uniquely combining an improved
50kV, 200 μA x-ray tube, closely optimized geometry, and patented
signal processing hardware and software. These advantages are
coupled with our proprietary drift detector—one of the largest area
drift detectors that is commercially available in a handheld XRF
analyzer—providing you with superior performance in the form of
faster analysis and lower detection limits. The final product is GE’s XLPMI+—a more versatile and technologically advanced handheld XRF
analyzer, designed without compromise to make you
more successful.

The Instrument of Choice
The XL-PMI+ is the instrument of choice when you require extreme
accuracy, precision, and ease of use, with its faster analysis, higher
precision, and the ability to measure light elements without helium or
vacuum assistance. It is the ideal instrument to analyze metal alloys
for industrial applications or final product QC. Additionally, you can
achieve enhanced Mg-S performance with the optional He purge.

CCD camera and small-spot feature
isolates and stores small sample area

GE’s XL-PMI+ provides you with many distinct advantages:
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Superior light element detection (Mg, Al, Si, P, S) without
helium purge or vacuum
High count rate for lower detection limits and
faster analysis
True lab-quality performance in a handheld instrument,
including tramp/trace elements

XL-PMI+

GE
Measurement & Control