Our instruments are characterized by the simplest possible operation combined with the capability of a high throughput. When it comes to new developments, we take great care to secure that the instruments will not "feel" like a prototype afterwards. Naturally, also new developments are supported by a corresponding software. Take cantilever change as an example: For our DS 95 AFM, exchanging the cantilever takes only some seconds. Adjustment and approach are fully automatic, and optionally we also offer a full automatic cantilever changer. Furthermore, all our AFM scanners have a built-in optics facilitating the location of a specific place on the sample surface. Both guarantee efficient work and a high throughput.
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نسخه متنی
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nnnn# Atomic Resolution
nnnn9 Visual Access
nnnn^ Fast Tip And Sample Exchange
nnnn• Uses Standard AFM Cantilevers
nnnnDanish Micro Engineering A/S
nnnnDME NanoTechnologie GmbH
nnnnDME
nnnnUltra High Vacuum SPM
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