Exicor® OIA0 pages

BIREFRINGENCE MEASUREMENT

Exicor OIA
PRODUCT BULLETIN

THE PREMIER BIREFRINGENCE MEASUREMENT

The system utilizes PEMs to modulate the polarization state

SYSTEM FOR OBLIQUE ANGLE EVALUATION OF

of a light beam and advanced detection and demodula-

LENSES, PARALLEL FACED, AND CURVED OPTICS!

tion electronics to measure how an optic has changed the
polarization state. This results in the measurement of optical

retardation of one polarization state relative to another at 90°.
Birefringence and Fast Axis orientation, as well as theoretical
residual stress, can be evaluated with this data.

The Hinds Instruments Exicor OIA is the Premier Birefringence
Measurement System for the evaluation of Lenses, Parallel
Faced Optics and Curved Optics at normal and oblique
incident angles. The system is built on Hinds Instruments
award winning Photoelastic Modulator (PEM) based Exicor®
Birefringence Measurement technology. This next generation

Hinds Instruments and the Exicor Oblique Incident Angle
Technology have been selected to evaluate optical birefringence in research and production by the world leaders in
lithographic lens blanks and nished lenses. Our systems
are surpassed by none!

birefringence measurement system is providing the industry
with new capabilities in the analysis and development of next
generation lithographic lenses, lens blank and high value
precision optics.

Technology for Polarization Measurement

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