150XT Mueller Polarimeter0 pages

BIREFRINGENCE MEASUREMENT

Exicor 150XT
P R O D U CT B U LLE T I N

Employing four Photoelastic Modulators (PEMs) in the

Exicor 150XT measures polarization properties integrated

same instrument, the 150XT Mueller Polarimeter provides

along an optical path through the optical sample under

simultaneous measurements of all sixteen Mueller matrix

investigation. A HeNe laser beam is polarized and then

elements and the complete polarization properties of a

modulated by the rst two PEMs. The modulated beam is

sample in a fraction of a second. This new addition to

transmitted through the sample and then passes through

Hinds Instruments’ Exicor product portfolio has applications

a combination of two more PEMs, an analyzer, and a

in academic and industrial research, optical component

photodetector. The electronic signals are processed through

characterization, manufacturing, and quality control. The

Fourier analysis of captured waveform (lock-in options

turnkey system maps linear retardation, circular retardation (or

available for even lower level signal detection).

optical rotation), linear diattenuation and circular diattenuation
in a wide variety of optical, chemical, and biochemical
samples.

A software algorithm, developed through a collaboration of
New York University and Hinds Instruments, converts the
signal levels from the electronics module into sixteen Mueller
matrix elements and the complete polarization properties of

LEADING EDGE SENSITIVITY AND REPEATABILITY

Using Hinds Instruments’ patented PEM technology, the
system provides the highest levels of sensitivity available
today for a full Mueller polarimeter. In addition, the PEMs

a sample. When operated in the automated mapping mode,
the x-y translation stage will move the sample to the next
predetermined measurement location. Results are displayed
instantaneously in user-specied formats.

provide high-speed operation, modulating at a rate of tens of
kHz. Leading edge sensitivity and repeatability easily provide
subnanometer levels of linear and circular birefringence
measurements and subpercentage determination of linear and
circular diattenuation, now critical to many applications.
CAREFULLY DESIGNED FOR SIMPLE, STRAIGHT
FORWARD OPERATION

A sample as large as 6” x 6” (150mm x 150mm; larger sizes
optional) can be characterized manually or automatically
mapped and graphically displayed. Once a sample is placed
on the translation stage, intuitive software guides the operator
through the step measurement process. User interface
software calculates the values of linear retardation, circular
retardation, linear diattenuation and circular diattenuation
and displays them in a variety of formats. The software also
provides le management and calibration features. In an
optional mode, instead of moving the sample on XY stages,
the sample can be tilted relative to the measuring light beam
using automated precision rotator or rotators to produce
angular maps of all sixteen Mueller matrix elements and all
polarization properties of a sample.

Technology for Polarization Measurement

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