Calibre xRC-CB0 pages
Calibre xRC-CB
Parasitic Extraction
D
A
T
A
S
H
E
E
Key Product Benefits:
• Offers detailed and accurate
transistor-level parasitic
extraction for cells, block and
small chips.
• Supports Lumped C,
Distributed RC and Distributed
RCC SPICE-type output
formats for simulators such as
Eldo, HSPICE and Spectre.
Calibre xRC-CB is for designers requiring detailed parasitic extraction on
cells, blocks and small chips. It is fully integrated with the Calibre product
family as well as within popular layout and simulation environments.
Calibre® xRC-CB: Accurate, Transistor-Level Parasitic
Extraction for Cells, Blocks and Small Chips
Designers developing small cells, blocks and chips require a
parasitic extraction tool that delivers accurate parasitic data for
comprehensive analysis and simulation.
Calibre xRC-CB parasitic extraction solution is independent of
design style or flow, and is easily invoked from within popular
layout environments via Calibre Interactive.™ Users can choose
Lumped C, Distributed RC and Distributed RCC SPICE-type
output formats to simulators such as Eldo, HSPICE and Spectre,
regenerating output netlists in a different format without
re-running the extraction engine, which saves time and effort.
Calibre xRC-CB also integrates with Calibre View (extracted
view) for post-layout simulation in the Cadence design
environment.
When combined with Calibre LVS™, Calibre xRC-CB provides
the only production-proven parasitic extraction tool set that
ensures accurate back-annotation to the source schematic.
www.mentor.com/dsm
• Supports Calibre View (extracted view) to augment the
Cadence DFII framework tools
for post-layout simulation.
• Regenerates output netlist in a
different format without having
to re-run the extraction engine.
• Easily invoked from within
Calibre Interactive.™ Results
are accessed through Calibre
RVE™, the robust results
viewing environment.
• Fully integrated with all
Calibre tools and is based on
the robust Calibre hierarchical
processing engine for optimum
performance and capability.
T
"